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The edge effect in scanning electron microscopy is the phenomenon in which the number of secondary and/or backscattered electrons that escape the sample and reach the detector is higher at an edge than at a surface. The interaction volume spreads far below the surface, but secondary electrons can only escape when close to the surface (generally about 10 nm, although this depends on the material). However, when the electron beam impacts an area close to the edge, electrons that are generated below an impact point that is close to an edge but that is far below the surface may be able to escape through the vertical surface instead.[citation needed]