Citation Hunt

Leaderboard

The Wikipedia snippet below is not backed by a reliable source. Can you find one?

Click I got this! to go to Wikipedia and fix the snippet, or Next! to see another one. Good luck!

In page Scanning electron microscope:

"

SEM samples have to be small enough to fit on the specimen stage, and may need special preparation to increase their electrical conductivity and to stabilize them, so that they can withstand the high vacuum conditions and the high energy beam of electrons. Samples are generally mounted rigidly on a specimen holder or stub using a conductive adhesive. SEM is used extensively for defect analysis of semiconductor wafers, and manufacturers make instruments that can examine any part of a 300 mm semiconductor wafer. Many instruments have chambers that can tilt an object of that size to 45° and provide continuous 360° rotation.[citation needed]